Test Compaction by Test Removal Under Transparent Scan
نویسندگان
چکیده
منابع مشابه
Test compaction for at-speed testing of scan circuits based onnonscan test. sequences and removal of transfer sequences
We propose a procedure for generating compact test sets with enhanced at-speed testing capabilities for scan circuits. Compaction refers here to a reduction in the test application time, while at-speed testing refers to the application of primary input sequences that contribute to the detection of delay defects. The proposed procedure generates an initial test set that has a low test applicatio...
متن کاملStatic Test Compaction for Multiple Full-Scan Circuits
Current design methodologies and methodologies for reducing test data volume and test application time for full-scan circuits allow testing of multiple circuits (or subcircuits of the same circuit) simultaneously using the same test data. We describe a static compaction procedure that accepts test sets generated independently for multiple full-scan circuits, and produces a compact test set that...
متن کاملConvolutional Compaction of Test Responses
This paper introduces a finite memory compactor called convolutional compactor that provides compaction ratios of test responses in excess of 100x even for a very small number of outputs. This is combined with the capability to detect multiple errors, handling of unknown states, and the ability to diagnose failing scan cells directly from compacted responses. A convolutional compactor can be ea...
متن کاملTest Scheduling and Scan-Chain Division under Power Constraint
An integrated technique for test scheduling and scan-chain division under power constraints is proposed in this paper. We demonstrate that optimal test time can be achieved for systems tested by an arbitrary number of tests per core using scan-chain division and we define an algorithm for it. The design of wrappers to allow different lengths of scanchains per core is also outlined. We investiga...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
سال: 2019
ISSN: 1063-8210,1557-9999
DOI: 10.1109/tvlsi.2018.2878067